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Print inspection with "PLATINUM" performances

Sentinel-CIS is an advanced quality control system for label based equipped with CIS sensor up to 600dpi.

Sentinel-CIS checks the print quality thanks to special verification functionality. It uses high resolution CIS sensor that allow the system to achieve a very high precision during the inspection.
Thanks to this specific technology it is possible to visualize and inspect all the parallel labels of one reel just with a single image.

A CIS scanner is a compact sensor which is mounted directly above the web under inspection. It is the same type sensor used in many fax or document scanners.
The CIS includes a row of silicon photodiodes, a lens array and a light source with cylindrical lenses.

Installation
Thanks to its highly flexible configuration Sentinel-CIS can be easily integrated into any production line. The system can be integrated into the printing machine where the web is stable.
The integration directly into the printing machine guarantees an immediate alarm in case of printing problem and helps in the waste reduction.
Sentinel-CIS can be installed on the slitter machine too where the system can be directly connected to the machine and stop it in case of defect on the reel.

Benefits
Sentinel-CIS is used either to detect and classify defects or to improve the process and increase the productivity. When a defect is found, the operator is alerted and he can take action immediately avoiding large amounts of waste. The type of defect is logged in order to provide a detailed report for each roll.
Sentinel-CIS ensures high levels of quality and offer the best solution for your production processes and converting operations maximizing yield, productivity, and quality. The reduction of waste and the optimization of the process help to rise the profits of the production.


System configurations

CIS 260

 

Max speed (step 2)

200 m/min

Max speed (full resolution)

100 m/min

Camera

CIS sensor

Field of view

260mm

Resolution

300 dpi (600dpi on request)

Minimum detectable defect in uniform area

0,05mm2 (dot of 0,2mm of diameter)

Minimum detectable defect in structured area

0,15mm2 (dot of 0,4mm of diameter)

 

CIS 520

 

Max speed (step 2)

200 m/min

Max speed (full resolution)

100 m/min

Camera

CIS sensor

Field of view

520mm

Resolution

300dpi (600dpi on request)

Minimum detectable defect in uniform area

0,05mm2 (dot of 0,2mm of diameter)

Minimum detectable defect in structured area

0,15mm2 (dot of 0,4mm of diameter)

 

All technical data are to be considered as a reference and they can be used for consultation only. Such data can be modified without any notice and therefore they have not to be considered binding

 

NEWS

InPrint 2019

November, 2019

K-2019

October, 2019

 

 

Label Expo

September, 2019

 

DeCo Immobiliare

August, 2019

DeCoSystem Immobiliare has been formally created.